Pattern Language as Support to Software Measurement Planning for Statistical Process Control

The growing interest of organizations in improving their software processes has led them to aim at achieving high maturity, where statistical process control (SPC) is required. One the challenges involved performing SPC selecting measures suitable for it. Measures used can be found literature and reused by organizations, but information dispersed, not favoring reuse. From suggested or practical experiences, it possible identify patterns that support measurement planning. Patterns organized as pattern languages, which favor reuse contribute towards increasing productivity. In this work, from results a systematic mapping survey, we identified planning Goal-Question-Metric format Measurement Planning Pattern Language (MePPLa). MePPLa was created following Systematic Approach creating Languages (SAMPPLa), also defined work. This paper presents SAMPPLa, main study carried out evaluate MePPLa. showed using viable useful aid Mainly, contributes productivity when plan quality resulting plan.